Evaluation of Wheat Genotypes for Genetic Variability, Genetic Potential and Yield Related Attributes in Agro-Climatic Conditions of Dera Ismail Khan

Abstract

Assessing wheat genotypes for genetic variability, yield potential, and heritability of yield-related traits is essential for developing high-yielding, climate-resilient wheat cultivars. Eighteen wheat genotypes were evaluated using a Randomized Complete Block Design (RCBD) with three replications at the Faculty of Agriculture Research Field, Gomal University, Dera Ismail Khan. Genotypes were subjected to investigation for analysis of variance (ANOVA), broad-sense heritability, and cluster analysis. Traits scored involve days to 50% headings, days to maturity, plant height, number of grains spike^-1, flag leaf area, number of spikelet’s spike^-1, grain yield plant^-1, and 1000-grains weight. Data collected was subjected to Statistic v.8.1 and SPSS. All traits depicted excellent variation among genotypes and were classified as highly significant (p < 0.01). Variation analysis involving GCV and PCV resulted in medium to high values for days to maturity & number of spikelet’s spike^-1, while low ranged for flag leaf area, plant height, grain yield plant^-1, number of grains spike^-1, and 1000-grains weight. Heritability of broad sense was recorded as in high ranges for traits like plant height, flag leaf area, grain yield plant^-1, number of grains spike^-1, number of spikelets spike^-1, and 1000-grain weight. Genetic advances in percent of mean showed an elevated magnitude in plant height, grain yield plant^-1, number of grains spike^-1, flag leaf area, and 1000-grains weight. Cluster analysis clustered eighteen genotypes into six clusters, based on the best performance for different yield-related attributes, and hence recommended the genotypes under study to be utilized in breeding programs for developing high-yielding wheat cultivars.